Scanning electron microscope

The Institute has a modern scanning electron microscope (SEM) - Zeiss EVO 15, with SE, BSE, EDX detectors, equipped with a tungsten filament. The device is designed for high-precision visualization of the structure of organic and inorganic materials. Due to the wide range of shooting mode settings, the microscope is actively used both in scientific research and in applied projects.

Scanning electron microscopy is a method of high-resolution visualization of the surface of objects using an electron beam. Unlike optical microscopes, SEM allows you to see micro- and nanostructures with high detail. The image is formed due to the interaction of electrons with the surface, which provides exceptional clarity and depth of field.

This method allows you to:

• examine the morphology and topography of the surface,
• analyze the microstructure of fabrics, materials, coatings,
• conduct elemental analysis,
• identify defects, microcracks and contamination.

We provide scanning electron microscopy services for scientific, medical, industrial and educational organizations. Our Institute uses modern protocols for preparing organic samples:

• biological tissues (e.g. organ fragments, cells, extracellular matrices).

Our services include:

• sample preparation (fixation, dehydration, metal coating),
• SE or BSE (secondary and backscattered electron) imaging,
• quantitative and qualitative elemental analysis (EDX),
• reporting and image interpretation consultations.